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Модель прибора, номер которой вы выбрали, уже снята с производства, но в наличии есть следующая справочная информация.
- Техническое описание
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Техническое описание Номер публикации: Дата выпуска BERTScope Clock Recovery Datasheet
65W-25479-9
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Руководства Тип руководства Номер по каталогу: Дата выпуска Tektronix BERTScope
Clock Recovery Declassification & Securities InstructionsИсключение из классификации 077110200 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualЭлектронное руководство по программированию 077069605 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualЭлектронное руководство по программированию 077069604 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualЭлектронное руководство по программированию 077069603 Tektronix BERTScope
Clock Recovery Instruments Quick Start User ManualОсновной потребитель 071285202 Tektronix BERTScope
BSAPCI3 InstructionsUser (Предварительные установки > Пользователь) 071304600 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualЭлектронное руководство по программированию 077069602 Tektronix BERTScope
Clock Recovery Instruments Quick Start User Manual.Основной потребитель 071285201 Tektronix BERTScope
BSA & BA Remote Control Guide Programmer ManualЭлектронное руководство по программированию 077069601 BERTScope Clock Recovery Quick Start Guide
This Quick Start User Manual supports the Tektronix BERTScope CR125A, CR175A, and CR286A Clock Recovery instruments. Quick Start User ManualUser (Предварительные установки > Пользователь) 077055700 BERTScope
Clock Recovery Instruments Quick Start User ManualUser (Предварительные установки > Пользователь) 071285200
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Техническая документация Тип документа Дата выпуска Stress Calibration for Jitter >1UI
While measuring the amount of jitter present on a signal is relatively straight forward conceptually; when the levels of jitter are small, amounts above a bit period (1 unit interval or UI) can be more difficult. This has practical consequences for …Примечание по применению Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces. Included is a test and characterization example using a Single Mode 1310 nm laser SFP+ …Начальное руководство Stressed Eye Primer
In addition to an introduction to stressed eye testing, this primer discusses some of the high-speed standards that use it, and how a receiver test using stressed eye is constructed.Начальное руководство PCI Express® Transmitter PLL Testing — A Comparison of Methods
There are several methods of measuring PLL loop response, based on the type of test instrumentation used. As expected, the various methods trade off test accuracy, test speed (throughput), ease of use, ease of setup, and initial cost. In addition …Начальное руководство Stressed Eye: “Know What You’re Really Testing With”
BER-based measurements can provide a better view of the stress eye opening down at the deep BER levels that the receiver will be expected to operate at when it is tested.Начальное руководство Clock Recovery Primer, Part 2
Part 2 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.Начальное руководство Clock Recovery Primer, Part 1
Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.Начальное руководство Dual-Dirac+ Scope Histograms and BERTScan Measurements
This primer discusses how the dual-Dirac relates to practical measurements that can be made with sampling scopes and BER-based instruments.Начальное руководство Evaluating Stress Components using BER-Based Jitter Measurements
This primers describes how jitter measurements can be self-verified using a BER-based Jitter Peak measurement and how to simplify the jitter measurement challenge by using a pattern that does not contribute pattern-dependent effects, and finally …Начальное руководство BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood”
Delve into jitter problems in new ways, such as examining Random Jitter on each edge of the data pattern, separating out the jitter caused by transmitter pre-emphasis, and performing jitter decomposition on long patterns such as PRBS-31.Примечание по применению Comparing Jitter Using a BERTScope® Bit Error Rate Testing
Comparison of DCD and F/2 Jitter.Примечание по применению Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester
Six sigma is a form of mask testing that provides for critical insight when mask testing depth specification are important for pass/fail testing or deeper evaluation on high-speed signaling standards to provide a significantly more complete picture …Примечание по применению Bridging the Gap Between BER and Eye Diagrams — A BER Contour Tutorial
BER Contour Measurement - What it is, how it is constructed, and why it is a valuable way of viewing parametric performance at gigabit speeds.Примечание по применению Clock Recovery’s Impact on Test and Measurement
As clock recovery becomes increasingly common in more systems and test setups, its effects on measurements must be considered. Many outside influences can disturb the relationship between data and how it is clocked. By understanding the relationship …Примечание по применению Anatomy of an Eye Diagram
This application note discusses different ways that information from an eye diagram can be sliced to gain more insight. It also discusses some basic ways that transmitters, channels, and receivers are tested.Примечание по применению BERTScope™ CR125A+ 175A+ & 286A Clock Recovery Fact Sheet
Key Specs and Ordering Information for BERTScope CR125A, 175A, & 286A Clock Recovery.Информационный бюллетень BERTScope Content Archive
To request copies of historical content from SyntheSys Research (now Tektronix Inc.) related to BERTScope and the following applications, please click the link below.Request NowКраткое техническое описание
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Программное обеспечение Тип документа Номер по каталогу: Дата выпуска BERTSCOPE PC APPLICATION SOFTWARE - V12.04.5608
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to a …Application (Предварительные установки > Приложение) 063430807 BERTSCOPE PC APPLICATION SOFTWARE - V12.04.5522
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to a …Application (Предварительные установки > Приложение) 063430806 BERTScopePC Software, V 10.15.1284
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B, DPP125C)and BSAITS instruments that are being operated as stand-alone instruments, i.e. not …Application (Предварительные установки > Приложение) 063430803 BERTScopeCR Help File V1.0
BERTScope Clock Recovery Instrument Help File for offline use.Application (Предварительные установки > Приложение) 066130900 BERTScopePC Software V 10.9.1024
The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to …Application (Предварительные установки > Приложение) 1000000482
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Часто задаваемые вопросы Идентификатор часто задаваемых вопросов On the PCIe PLL Bandwidth Tester Windows application that's used with the CR286A, there is a drop down under "Options" called "Enhanced Measurement" and has the options of "Standard", "Sensitive", and "Disabled".What does each option do?
In 8G mode only, some DUT’s are sensitive to the initialization routine, which involves forcing a re-lock of the DUT PLL several times to optimize the peaking measurement.The “Standard” selection uses a method that toggles the CR divider reset to …72106 What is the electrical specifications for SMAPOWERDIV used with the Clock Recovery in Tektronix BERT scopes?
NOMINAL IMPEDANCE: 50 ohm FREQUENCY RANGE: dc to 18.0 GHz INSERTION LOSS (between input & either output arm): 6 dB nominal, -0.2 dB, +1.2 to 10 GHz, 1.5 to 18 GHz MAXIMUM INPUT POWER: 1 watt CW, 1 kilowatt peak (5 μsec pulse width, 0.05% duty cycle …64616 How do I use TekExpress to perform a USB 3.0 Device Transmitter Test?
USB 3 Tx Testing ScriptHello and welcome to Tektronix! Today I’m going to walk through a USB 3 Device Transmitter Test using TekExpress.A USB 3 Transmitter test consists of acquiring the signal from a USB 3 Device and running it through various tests …69376
